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Electrical Characterization of Amorphous Silicon MIS-Based Structures for HIT Solar Cell Applications

A complete electrical characterization of hydrogenated amorphous silicon layers (a-Si:H) deposited on crystalline silicon (c-Si) substrates by electron cyclotron resonance chemical vapor deposition (ECR-CVD) was carried out. These structures are of interest for photovoltaic applications. Different g...

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Detalles Bibliográficos
Autores principales:	García, Héctor, Castán, Helena, Dueñas, Salvador, Bailón, Luis, García-Hernansanz, Rodrigo, Olea, Javier, del Prado, Álvaro, Mártil, Ignacio
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2016
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4947466/ https://www.ncbi.nlm.nih.gov/pubmed/27423876 http://dx.doi.org/10.1186/s11671-016-1545-z

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