The intrinsic defect structure of exfoliated MoS(2) single layers revealed by Scanning Tunneling Microscopy

MoS(2) single layers have recently emerged as strong competitors of graphene in electronic and optoelectronic device applications due to their intrinsic direct bandgap. However, transport measurements reveal the crucial role of defect-induced electronic states, pointing out the fundamental importanc...

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Detalles Bibliográficos
Autores principales: Vancsó, Péter, Magda, Gábor Zsolt, Pető, János, Noh, Ji-Young, Kim, Yong-Sung, Hwang, Chanyong, Biró, László P., Tapasztó, Levente
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4957227/
https://www.ncbi.nlm.nih.gov/pubmed/27445217
http://dx.doi.org/10.1038/srep29726

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4957227/
https://www.ncbi.nlm.nih.gov/pubmed/27445217
http://dx.doi.org/10.1038/srep29726

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