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The intrinsic defect structure of exfoliated MoS(2) single layers revealed by Scanning Tunneling Microscopy
MoS(2) single layers have recently emerged as strong competitors of graphene in electronic and optoelectronic device applications due to their intrinsic direct bandgap. However, transport measurements reveal the crucial role of defect-induced electronic states, pointing out the fundamental importanc...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4957227/ https://www.ncbi.nlm.nih.gov/pubmed/27445217 http://dx.doi.org/10.1038/srep29726 |