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Structural and electrical properties of oxygen complexes in Cz and FZ silicon crystals implanted with carbon ions

34.50.Dy; 61.10.-i; 68.35.Dv ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (doi:10.1186/1556-276X-9-693) contains supplementary material, which is available to authorized users.

Detalles Bibliográficos
Autores principales: Romanyuk, Boris, Melnik, Victor, Popov, Valentin, Babich, Vilik, Kladko, Vasyl, Gudymenko, Olexandr, Ilchenko, Volodimir, Vasyliev, Iegor, Goriachko, Andrii
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer New York 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4967622/
https://www.ncbi.nlm.nih.gov/pubmed/27233647
http://dx.doi.org/10.1186/1556-276X-9-693
Descripción
Sumario:34.50.Dy; 61.10.-i; 68.35.Dv ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (doi:10.1186/1556-276X-9-693) contains supplementary material, which is available to authorized users.