Rotation of X-ray polarization in the glitches of a silicon crystal monochromator

EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the ‘glitches’ produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specifi...

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Detalles Bibliográficos
Autores principales: Sutter, John P., Boada, Roberto, Bowron, Daniel T., Stepanov, Sergey A., Díaz-Moreno, Sofía
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970495/
https://www.ncbi.nlm.nih.gov/pubmed/27504076
http://dx.doi.org/10.1107/S1600576716009183

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970495/
https://www.ncbi.nlm.nih.gov/pubmed/27504076
http://dx.doi.org/10.1107/S1600576716009183

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