Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

Kelvin probe force microscopy (KPFM) has provided deep insights into the local electronic, ionic and electrochemical functionalities in a broad range of materials and devices. In classical KPFM, which utilizes heterodyne detection and closed loop bias feedback, the cantilever response is down-sample...

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Detalles Bibliográficos
Autores principales: Collins, Liam, Belianinov, Alex, Somnath, Suhas, Balke, Nina, Kalinin, Sergei V., Jesse, Stephen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4981877/
https://www.ncbi.nlm.nih.gov/pubmed/27514987
http://dx.doi.org/10.1038/srep30557

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4981877/
https://www.ncbi.nlm.nih.gov/pubmed/27514987
http://dx.doi.org/10.1038/srep30557

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