Measurement of the across-plane conductivity of YSZ thin films on silicon

Across-plane conductivity measurements on ion conducting thin films of a few ten nanometers thickness are challenging due to frequently occurring short-circuits through pinholes in the layer. In this contribution, a method is proposed which allowed across-plane conductivity measurements on yttria st...

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Detalles Bibliográficos
Autores principales: Navickas, E., Gerstl, M., Friedbacher, G., Kubel, F., Fleig, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier Science B.V 2012
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986284/
https://www.ncbi.nlm.nih.gov/pubmed/27570328
http://dx.doi.org/10.1016/j.ssi.2012.01.007

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986284/
https://www.ncbi.nlm.nih.gov/pubmed/27570328
http://dx.doi.org/10.1016/j.ssi.2012.01.007

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