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Measurement of the across-plane conductivity of YSZ thin films on silicon

Across-plane conductivity measurements on ion conducting thin films of a few ten nanometers thickness are challenging due to frequently occurring short-circuits through pinholes in the layer. In this contribution, a method is proposed which allowed across-plane conductivity measurements on yttria st...

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Detalles Bibliográficos
Autores principales:	Navickas, E., Gerstl, M., Friedbacher, G., Kubel, F., Fleig, J.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Elsevier Science B.V 2012
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986284/ https://www.ncbi.nlm.nih.gov/pubmed/27570328 http://dx.doi.org/10.1016/j.ssi.2012.01.007

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