Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films

In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for ex...

Descripción completa

Detalles Bibliográficos
Autores principales: Gerstl, M., Frömling, T., Schintlmeister, A., Hutter, H., Fleig, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier Science B.V 2011
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986288/
https://www.ncbi.nlm.nih.gov/pubmed/27570326
http://dx.doi.org/10.1016/j.ssi.2010.08.013

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986288/
https://www.ncbi.nlm.nih.gov/pubmed/27570326
http://dx.doi.org/10.1016/j.ssi.2010.08.013

Ejemplares similares