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Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films

In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for ex...

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Detalles Bibliográficos
Autores principales: Gerstl, M., Frömling, T., Schintlmeister, A., Hutter, H., Fleig, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier Science B.V 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986288/
https://www.ncbi.nlm.nih.gov/pubmed/27570326
http://dx.doi.org/10.1016/j.ssi.2010.08.013
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author Gerstl, M.
Frömling, T.
Schintlmeister, A.
Hutter, H.
Fleig, J.
author_facet Gerstl, M.
Frömling, T.
Schintlmeister, A.
Hutter, H.
Fleig, J.
author_sort Gerstl, M.
collection PubMed
description In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for example into an yttria stabilized zirconia (YSZ) layer at low temperatures with the aid of an electric current, thus overcoming slow thermal oxygen exchange while still limiting lateral diffusion to a minimum. In the second step controlled diffusion takes place at elevated temperatures in ultra high vacuum (UHV) to impede loss of tracer due to oxygen exchange at the film surface. In this second step the surface of the thin film may additionally be modified compared to the oxygen incorporation step. This allows to easily investigate effects of interfaces on ion transport. The achieved in-plane concentration profiles are then measured by secondary ion mass spectrometry (SIMS). Comparison with electrical measurements on YSZ thin films proves the applicability of the method.
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spelling pubmed-49862882016-08-25 Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films Gerstl, M. Frömling, T. Schintlmeister, A. Hutter, H. Fleig, J. Solid State Ion Article In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of (18)O tracer is locally incorporated for example into an yttria stabilized zirconia (YSZ) layer at low temperatures with the aid of an electric current, thus overcoming slow thermal oxygen exchange while still limiting lateral diffusion to a minimum. In the second step controlled diffusion takes place at elevated temperatures in ultra high vacuum (UHV) to impede loss of tracer due to oxygen exchange at the film surface. In this second step the surface of the thin film may additionally be modified compared to the oxygen incorporation step. This allows to easily investigate effects of interfaces on ion transport. The achieved in-plane concentration profiles are then measured by secondary ion mass spectrometry (SIMS). Comparison with electrical measurements on YSZ thin films proves the applicability of the method. Elsevier Science B.V 2011-03-03 /pmc/articles/PMC4986288/ /pubmed/27570326 http://dx.doi.org/10.1016/j.ssi.2010.08.013 Text en © 2011 Elsevier B.V. https://creativecommons.org/licenses/by-nc-nd/3.0/This is an open access article under the CC BY NC ND license (https://creativecommons.org/licenses/by-nc-nd/3.0/).
spellingShingle Article
Gerstl, M.
Frömling, T.
Schintlmeister, A.
Hutter, H.
Fleig, J.
Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title_full Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title_fullStr Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title_full_unstemmed Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title_short Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films
title_sort measurement of (18)o tracer diffusion coefficients in thin yttria stabilized zirconia films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986288/
https://www.ncbi.nlm.nih.gov/pubmed/27570326
http://dx.doi.org/10.1016/j.ssi.2010.08.013
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