Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol

Data included in this article are associated with the research article entitled ‘Protocol of single cells preparation for time-of-flight secondary ion mass spectrometry’ (Bobrowska et al., 2016 in press) [1]. This data file contains topography images of single melanoma cells recorded using atomic fo...

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Detalles Bibliográficos
Autores principales: Bobrowska, J., Pabijan, J., Wiltowska-Zuber, J., Jany, B.R., Krok, F., Awsiuk, K., Rysz, J., Budkowski, A., Lekka, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2016
Materias:
Data Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4990642/
https://www.ncbi.nlm.nih.gov/pubmed/27570811
http://dx.doi.org/10.1016/j.dib.2016.07.052

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4990642/
https://www.ncbi.nlm.nih.gov/pubmed/27570811
http://dx.doi.org/10.1016/j.dib.2016.07.052

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