Measurement and Modeling of Short and Medium Range Order in Amorphous Ta(2)O(5) Thin Films

Amorphous films and coatings are rapidly growing in importance. Yet, there is a dearth of high-quality structural data on sub-micron films. Not understanding how these materials assemble at atomic scale limits fundamental insights needed to improve their performance. Here, we use grazing-incidence x...

Descripción completa

Detalles Bibliográficos
Autores principales: Shyam, Badri, Stone, Kevin H., Bassiri, Riccardo, Fejer, Martin M., Toney, Michael F., Mehta, Apurva
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4999889/
https://www.ncbi.nlm.nih.gov/pubmed/27562542
http://dx.doi.org/10.1038/srep32170

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4999889/
https://www.ncbi.nlm.nih.gov/pubmed/27562542
http://dx.doi.org/10.1038/srep32170

Ejemplares similares