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Measurement and Modeling of Short and Medium Range Order in Amorphous Ta(2)O(5) Thin Films
Amorphous films and coatings are rapidly growing in importance. Yet, there is a dearth of high-quality structural data on sub-micron films. Not understanding how these materials assemble at atomic scale limits fundamental insights needed to improve their performance. Here, we use grazing-incidence x...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4999889/ https://www.ncbi.nlm.nih.gov/pubmed/27562542 http://dx.doi.org/10.1038/srep32170 |