Optical nano artifact metrics using silicon random nanostructures

Nano-artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Things where securing identities is critical. However, expensive and huge experimental apparatuses, such as scanning electro...

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Detalles Bibliográficos
Autores principales: Matsumoto, Tsutomu, Yoshida, Naoki, Nishio, Shumpei, Hoga, Morihisa, Ohyagi, Yasuyuki, Tate, Naoya, Naruse, Makoto
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5006022/
https://www.ncbi.nlm.nih.gov/pubmed/27578146
http://dx.doi.org/10.1038/srep32438

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5006022/
https://www.ncbi.nlm.nih.gov/pubmed/27578146
http://dx.doi.org/10.1038/srep32438

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