Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures

The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping. The STEM has not been regarded as optimal for the phase-contrast im...

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Detalles Bibliográficos
Autores principales: Yang, H., Rutte, R. N., Jones, L., Simson, M., Sagawa, R., Ryll, H., Huth, M., Pennycook, T. J., Green, M.L.H., Soltau, H., Kondo, Y., Davis, B. G., Nellist, P. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007440/
https://www.ncbi.nlm.nih.gov/pubmed/27561914
http://dx.doi.org/10.1038/ncomms12532

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007440/
https://www.ncbi.nlm.nih.gov/pubmed/27561914
http://dx.doi.org/10.1038/ncomms12532

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