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Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping. The STEM has not been regarded as optimal for the phase-contrast im...
Autores principales: | , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007440/ https://www.ncbi.nlm.nih.gov/pubmed/27561914 http://dx.doi.org/10.1038/ncomms12532 |
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author | Yang, H. Rutte, R. N. Jones, L. Simson, M. Sagawa, R. Ryll, H. Huth, M. Pennycook, T. J. Green, M.L.H. Soltau, H. Kondo, Y. Davis, B. G. Nellist, P. D. |
author_facet | Yang, H. Rutte, R. N. Jones, L. Simson, M. Sagawa, R. Ryll, H. Huth, M. Pennycook, T. J. Green, M.L.H. Soltau, H. Kondo, Y. Davis, B. G. Nellist, P. D. |
author_sort | Yang, H. |
collection | PubMed |
description | The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping. The STEM has not been regarded as optimal for the phase-contrast imaging necessary for efficient imaging of light materials. Here, recent developments in fast electron detectors and data processing capability is shown to enable electron ptychography, to extend the capability of the STEM by allowing quantitative phase images to be formed simultaneously with incoherent signals. We demonstrate this capability as a practical tool for imaging complex structures containing light and heavy elements, and use it to solve the structure of a beam-sensitive carbon nanostructure. The contrast of the phase image contrast is maximized through the post-acquisition correction of lens aberrations. The compensation of defocus aberrations is also used for the measurement of three-dimensional sample information through post-acquisition optical sectioning. |
format | Online Article Text |
id | pubmed-5007440 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-50074402016-09-14 Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures Yang, H. Rutte, R. N. Jones, L. Simson, M. Sagawa, R. Ryll, H. Huth, M. Pennycook, T. J. Green, M.L.H. Soltau, H. Kondo, Y. Davis, B. G. Nellist, P. D. Nat Commun Article The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping. The STEM has not been regarded as optimal for the phase-contrast imaging necessary for efficient imaging of light materials. Here, recent developments in fast electron detectors and data processing capability is shown to enable electron ptychography, to extend the capability of the STEM by allowing quantitative phase images to be formed simultaneously with incoherent signals. We demonstrate this capability as a practical tool for imaging complex structures containing light and heavy elements, and use it to solve the structure of a beam-sensitive carbon nanostructure. The contrast of the phase image contrast is maximized through the post-acquisition correction of lens aberrations. The compensation of defocus aberrations is also used for the measurement of three-dimensional sample information through post-acquisition optical sectioning. Nature Publishing Group 2016-08-26 /pmc/articles/PMC5007440/ /pubmed/27561914 http://dx.doi.org/10.1038/ncomms12532 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Yang, H. Rutte, R. N. Jones, L. Simson, M. Sagawa, R. Ryll, H. Huth, M. Pennycook, T. J. Green, M.L.H. Soltau, H. Kondo, Y. Davis, B. G. Nellist, P. D. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title | Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title_full | Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title_fullStr | Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title_full_unstemmed | Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title_short | Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures |
title_sort | simultaneous atomic-resolution electron ptychography and z-contrast imaging of light and heavy elements in complex nanostructures |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007440/ https://www.ncbi.nlm.nih.gov/pubmed/27561914 http://dx.doi.org/10.1038/ncomms12532 |
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