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Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging modes such as Z-contrast and spectroscopic mapping. The STEM has not been regarded as optimal for the phase-contrast im...
Autores principales: | Yang, H., Rutte, R. N., Jones, L., Simson, M., Sagawa, R., Ryll, H., Huth, M., Pennycook, T. J., Green, M.L.H., Soltau, H., Kondo, Y., Davis, B. G., Nellist, P. D. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007440/ https://www.ncbi.nlm.nih.gov/pubmed/27561914 http://dx.doi.org/10.1038/ncomms12532 |
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