Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level

This paper presents a robust method for defect detection in textures, entropy-based automatic selection of the wavelet decomposition level (EADL), based on a wavelet reconstruction scheme, for detecting defects in a wide variety of structural and statistical textures. Two main features are presented...

Descripción completa

Detalles Bibliográficos
Autores principales: Navarro, Pedro J., Fernández-Isla, Carlos, Alcover, Pedro María, Suardíaz, Juan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017344/
https://www.ncbi.nlm.nih.gov/pubmed/27472343
http://dx.doi.org/10.3390/s16081178

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017344/
https://www.ncbi.nlm.nih.gov/pubmed/27472343
http://dx.doi.org/10.3390/s16081178

Ejemplares similares