Coma aberrations in combined two- and three-dimensional STED nanoscopy

Stimulated emission depletion (STED) microscopes, like all super-resolution methods, are sensitive to aberrations. Of particular importance are aberrations that affect the quality of the depletion focus, which requires a point of near-zero intensity surrounded by strong illumination. We present anal...

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Detalles Bibliográficos
Autores principales: Antonello, Jacopo, Kromann, Emil B., Burke, Daniel, Bewersdorf, Joerg, Booth, Martin J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017529/
https://www.ncbi.nlm.nih.gov/pubmed/27472636

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017529/
https://www.ncbi.nlm.nih.gov/pubmed/27472636

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