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Dynamics of surface evolution in semiconductor thin films grown from a chemical bath
Dynamics of surface evolution in CdS thin films grown by chemical bath deposition technique has been studied from time sequence of atomic force micrographs. Detailed scaling analysis of surface fluctuation in real and Fourier space yielded characteristic exponents α(loc) = 0.78 ± 0.07, α = 2.20 ± 0....
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group
2016
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5018873/ https://www.ncbi.nlm.nih.gov/pubmed/27615367 http://dx.doi.org/10.1038/srep33136 |