Enhanced Crystallization Behaviors of Silicon-Doped Sb(2)Te Films: Optical Evidences

The optical properties and structural variations of silicon (Si) doped Sb(2)Te (SST) films as functions of temperature (210–620 K) and Si concentration (0–33%) have been investigated by the means of temperature dependent Raman scattering and spectroscopic ellipsometry experiments. Based upon the cha...

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Detalles Bibliográficos
Autores principales: Guo, Shuang, Xu, Liping, Zhang, Jinzhong, Hu, Zhigao, Li, Tao, Wu, Liangcai, Song, Zhitang, Chu, Junhao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5027526/
https://www.ncbi.nlm.nih.gov/pubmed/27640336
http://dx.doi.org/10.1038/srep33639

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5027526/
https://www.ncbi.nlm.nih.gov/pubmed/27640336
http://dx.doi.org/10.1038/srep33639

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