Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM

This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition (EEMD), relative entropy, and extreme learning machine (ELM). First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsi...

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Detalles Bibliográficos
Autores principales: Xiong, Jian, Tian, Shulin, Yang, Chenglin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2016
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5031911/
https://www.ncbi.nlm.nih.gov/pubmed/27698663
http://dx.doi.org/10.1155/2016/7657054

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5031911/
https://www.ncbi.nlm.nih.gov/pubmed/27698663
http://dx.doi.org/10.1155/2016/7657054

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