Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

RATIONALE: In Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and focused primary ion beams enable mass spectrometry imaging, a method which is particularly useful to map various small molecules such as lipids at the surface of biological samples. When using TOF‐SIMS instruments, t...

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Detalles Bibliográficos
Autores principales: Vanbellingen, Quentin P., Elie, Nicolas, Eller, Michael J., Della‐Negra, Serge, Touboul, David, Brunelle, Alain
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2015
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5033000/
https://www.ncbi.nlm.nih.gov/pubmed/26395603
http://dx.doi.org/10.1002/rcm.7210

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5033000/
https://www.ncbi.nlm.nih.gov/pubmed/26395603
http://dx.doi.org/10.1002/rcm.7210

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