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Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions
RATIONALE: In Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and focused primary ion beams enable mass spectrometry imaging, a method which is particularly useful to map various small molecules such as lipids at the surface of biological samples. When using TOF‐SIMS instruments, t...
Autores principales: | Vanbellingen, Quentin P., Elie, Nicolas, Eller, Michael J., Della‐Negra, Serge, Touboul, David, Brunelle, Alain |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5033000/ https://www.ncbi.nlm.nih.gov/pubmed/26395603 http://dx.doi.org/10.1002/rcm.7210 |
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