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High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions
Fill factors (FFs) of ~0.87 have been obtained for crystalline Si (c-Si) solar cells based on Ag front contacts after rapid thermal annealing. The usual single PN junction model fails to explain the high FF result. A metal/oxide/semiconductor (MOS) junction at the emitter is found to be inversely co...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5056919/ https://www.ncbi.nlm.nih.gov/pubmed/27726121 http://dx.doi.org/10.1186/s11671-016-1678-0 |
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author | Wang, Liang-Xing Zhou, Zhi-Quan Zhang, Tian-Ning Chen, Xin Lu, Ming |
author_facet | Wang, Liang-Xing Zhou, Zhi-Quan Zhang, Tian-Ning Chen, Xin Lu, Ming |
author_sort | Wang, Liang-Xing |
collection | PubMed |
description | Fill factors (FFs) of ~0.87 have been obtained for crystalline Si (c-Si) solar cells based on Ag front contacts after rapid thermal annealing. The usual single PN junction model fails to explain the high FF result. A metal/oxide/semiconductor (MOS) junction at the emitter is found to be inversely connected to the PN one, and when its barrier height/e is close to the open-circuit voltage of the solar cell, very high FF is obtainable. In this work, although the open-circuit voltage (<580 mV) is not high here, the efficiency of c-Si solar cell still reaches the state-of-the-art value (>20 %) due to the high FF achieved. |
format | Online Article Text |
id | pubmed-5056919 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Springer US |
record_format | MEDLINE/PubMed |
spelling | pubmed-50569192016-10-26 High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions Wang, Liang-Xing Zhou, Zhi-Quan Zhang, Tian-Ning Chen, Xin Lu, Ming Nanoscale Res Lett Nano Express Fill factors (FFs) of ~0.87 have been obtained for crystalline Si (c-Si) solar cells based on Ag front contacts after rapid thermal annealing. The usual single PN junction model fails to explain the high FF result. A metal/oxide/semiconductor (MOS) junction at the emitter is found to be inversely connected to the PN one, and when its barrier height/e is close to the open-circuit voltage of the solar cell, very high FF is obtainable. In this work, although the open-circuit voltage (<580 mV) is not high here, the efficiency of c-Si solar cell still reaches the state-of-the-art value (>20 %) due to the high FF achieved. Springer US 2016-10-10 /pmc/articles/PMC5056919/ /pubmed/27726121 http://dx.doi.org/10.1186/s11671-016-1678-0 Text en © The Author(s). 2016 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. |
spellingShingle | Nano Express Wang, Liang-Xing Zhou, Zhi-Quan Zhang, Tian-Ning Chen, Xin Lu, Ming High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title | High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title_full | High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title_fullStr | High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title_full_unstemmed | High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title_short | High Fill Factors of Si Solar Cells Achieved by Using an Inverse Connection Between MOS and PN Junctions |
title_sort | high fill factors of si solar cells achieved by using an inverse connection between mos and pn junctions |
topic | Nano Express |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5056919/ https://www.ncbi.nlm.nih.gov/pubmed/27726121 http://dx.doi.org/10.1186/s11671-016-1678-0 |
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