Time-resolved HAXPES using a microfocused XFEL beam: From vacuum space-charge effects to intrinsic charge-carrier recombination dynamics

Time-resolved hard X-ray photoelectron spectroscopy (trHAXPES) using microfocused X-ray free-electron laser (XFEL, hν = 8 keV) pulses as a probe and infrared laser pulses (hν = 1.55 eV) as a pump is employed to determine intrinsic charge-carrier recombination dynamics in La:SrTiO(3). By means of a c...

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Detalles Bibliográficos
Autores principales: Oloff, Lars-Philip, Chainani, Ashish, Matsunami, Masaharu, Takahashi, Kazutoshi, Togashi, Tadashi, Osawa, Hitoshi, Hanff, Kerstin, Quer, Arndt, Matsushita, Ryuki, Shiraishi, Ryutaro, Nagashima, Maki, Kimura, Ayato, Matsuishi, Kotaro, Yabashi, Makina, Tanaka, Yoshihito, Rossi, Giorgio, Ishikawa, Tetsuya, Rossnagel, Kai, Oura, Masaki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5059660/
https://www.ncbi.nlm.nih.gov/pubmed/27731408
http://dx.doi.org/10.1038/srep35087

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5059660/
https://www.ncbi.nlm.nih.gov/pubmed/27731408
http://dx.doi.org/10.1038/srep35087

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