Stability and its mechanism in Ag/CoO(x)/Ag interface-type resistive switching device

Stability is an important issue for the application of resistive switching (RS) devices. In this work, the endurance and retention properties of Ag/CoO(x)/Ag interface-type RS device were investigated. This device exhibits rectifying I–V curve, multilevel storage states and retention decay behavior,...

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Detalles Bibliográficos
Autores principales: Fu, Jianbo, Hua, Muxin, Ding, Shilei, Chen, Xuegang, Wu, Rui, Liu, Shunquan, Han, Jingzhi, Wang, Changsheng, Du, Honglin, Yang, Yingchang, Yang, Jinbo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5069483/
https://www.ncbi.nlm.nih.gov/pubmed/27759116
http://dx.doi.org/10.1038/srep35630

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5069483/
https://www.ncbi.nlm.nih.gov/pubmed/27759116
http://dx.doi.org/10.1038/srep35630

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