Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling

Scattering-type scanning near-field optical microscopy (s-SNOM) allows spectroscopic imaging with spatial resolution below the diffraction limit. With suitable light sources, s-SNOM is instrumental in numerous discoveries at the nanoscale. So far, the light sources have been limited to continuous wa...

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Detalles Bibliográficos
Autores principales: Wang, Haomin, Wang, Le, Xu, Xiaoji G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5071641/
https://www.ncbi.nlm.nih.gov/pubmed/27748360
http://dx.doi.org/10.1038/ncomms13212

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5071641/
https://www.ncbi.nlm.nih.gov/pubmed/27748360
http://dx.doi.org/10.1038/ncomms13212

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