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Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling
Scattering-type scanning near-field optical microscopy (s-SNOM) allows spectroscopic imaging with spatial resolution below the diffraction limit. With suitable light sources, s-SNOM is instrumental in numerous discoveries at the nanoscale. So far, the light sources have been limited to continuous wa...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group
2016
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5071641/ https://www.ncbi.nlm.nih.gov/pubmed/27748360 http://dx.doi.org/10.1038/ncomms13212 |