Micrometer-resolution imaging using MÖNCH: towards G(2)-less grating interferometry

MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron application...

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Detalles Bibliográficos
Autores principales: Cartier, Sebastian, Kagias, Matias, Bergamaschi, Anna, Wang, Zhentian, Dinapoli, Roberto, Mozzanica, Aldo, Ramilli, Marco, Schmitt, Bernd, Brückner, Martin, Fröjdh, Erik, Greiffenberg, Dominic, Mayilyan, Davit, Mezza, Davide, Redford, Sophie, Ruder, Christian, Schädler, Lukas, Shi, Xintian, Thattil, Dhanya, Tinti, Gemma, Zhang, Jiaguo, Stampanoni, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5082464/
https://www.ncbi.nlm.nih.gov/pubmed/27787252
http://dx.doi.org/10.1107/S1600577516014788

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5082464/
https://www.ncbi.nlm.nih.gov/pubmed/27787252
http://dx.doi.org/10.1107/S1600577516014788

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