Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography

An application of spectral domain optical coherence tomography (SD-OCT) was demonstrated for a fast industrial inspection of an optical thin film panel. An optical thin film sample similar to a liquid crystal display (LCD) panel was examined. Two identical SD-OCT systems were utilized for parallel s...

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Detalles Bibliográficos
Autores principales: Shirazi, Muhammad Faizan, Park, Kibeom, Wijesinghe, Ruchire Eranga, Jeong, Hyosang, Han, Sangyeob, Kim, Pilun, Jeon, Mansik, Kim, Jeehyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5087387/
https://www.ncbi.nlm.nih.gov/pubmed/27690043
http://dx.doi.org/10.3390/s16101598

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5087387/
https://www.ncbi.nlm.nih.gov/pubmed/27690043
http://dx.doi.org/10.3390/s16101598

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