(18)O-tracer diffusion along nanoscaled Sc(2)O(3)/yttria stabilized zirconia (YSZ) multilayers: on the influence of strain

The oxygen tracer diffusion coefficient describing transport along nano-/microscaled YSZ/Sc(2)O(3) multilayers as a function of the thick­ness of the ion-conducting YSZ layers has been measured by isotope exchange depth profiling (IEDP), using secondary ion mass spec­trometry (SIMS). The multilayer...

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Detalles Bibliográficos
Autores principales: Aydin, Halit, Korte, Carsten, Janek, Jürgen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2013
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090511/
https://www.ncbi.nlm.nih.gov/pubmed/27877580
http://dx.doi.org/10.1088/1468-6996/14/3/035007

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090511/
https://www.ncbi.nlm.nih.gov/pubmed/27877580
http://dx.doi.org/10.1088/1468-6996/14/3/035007

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