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(18)O-tracer diffusion along nanoscaled Sc(2)O(3)/yttria stabilized zirconia (YSZ) multilayers: on the influence of strain
The oxygen tracer diffusion coefficient describing transport along nano-/microscaled YSZ/Sc(2)O(3) multilayers as a function of the thickness of the ion-conducting YSZ layers has been measured by isotope exchange depth profiling (IEDP), using secondary ion mass spectrometry (SIMS). The multilayer...
Autores principales: | Aydin, Halit, Korte, Carsten, Janek, Jürgen |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090511/ https://www.ncbi.nlm.nih.gov/pubmed/27877580 http://dx.doi.org/10.1088/1468-6996/14/3/035007 |
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