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Modeling of metastable phase formation diagrams for sputtered thin films

A method to model the metastable phase formation in the Cu–W system based on the critical surface diffusion distance has been developed. The driver for the formation of a second phase is the critical diffusion distance which is dependent on the solubility of W in Cu and on the solubility of Cu in W....

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Detalles Bibliográficos
Autores principales: Chang, Keke, Music, Denis, to Baben, Moritz, Lange, Dennis, Bolvardi, Hamid, Schneider, Jochen M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5101876/
https://www.ncbi.nlm.nih.gov/pubmed/27877871
http://dx.doi.org/10.1080/14686996.2016.1167572