Atom Diffusion and Evaporation of Free-Ended Amorphous SiO(x) Nanowires: Nanocurvature Effect and Beam-Induced Athermal Activation Effect

Arresting effects of nanocurvature and electron beam-induced athermal activation on the structure changes at nanoscale of free-ended amorphous SiO(x) nanowire were demonstrated. It was observed that under in situ uniform electron beam irradiation in transmission electron microscope, the near surface...

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Detalles Bibliográficos
Autores principales: Su, Jiangbin, Zhu, Xianfang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2016
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5120135/
https://www.ncbi.nlm.nih.gov/pubmed/27878577
http://dx.doi.org/10.1186/s11671-016-1735-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5120135/
https://www.ncbi.nlm.nih.gov/pubmed/27878577
http://dx.doi.org/10.1186/s11671-016-1735-8

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