Longitudinal conductivity of LaF(3)/SrF(2) multilayer heterostructures

LaF(3)/SrF(2) multilayer heterostructures with thicknesses of individual layers in the range 5–100 nm have been grown on MgO(100) substrates using molecular beam epitaxy. The longitudinal conductivity of the films has been measured using impedance spectroscopy in the frequency range 10(−1)–10(6) Hz...

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Detalles Bibliográficos
Autores principales: Vergentev, Tikhon, Banshchikov, Alexander, Filimonov, Alexey, Koroleva, Ekaterina, Sokolov, Nikolay, Wurz, Marc Christopher
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2016
Materias:
Optical, Magnetic and Electronic Device Materials
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5127268/
https://www.ncbi.nlm.nih.gov/pubmed/27933119
http://dx.doi.org/10.1080/14686996.2016.1246940

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5127268/
https://www.ncbi.nlm.nih.gov/pubmed/27933119
http://dx.doi.org/10.1080/14686996.2016.1246940

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