Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy

We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target—the scanning field-emission microscopy regime (SFM). In the SFM mode, a secondary-electron contrast as high as 30% is observed when imag...

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Detalles Bibliográficos
Autores principales: Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th., Pescia, D., Ramsperger, U.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society Publishing 2016
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5134307/
https://www.ncbi.nlm.nih.gov/pubmed/27956876
http://dx.doi.org/10.1098/rspa.2016.0475

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5134307/
https://www.ncbi.nlm.nih.gov/pubmed/27956876
http://dx.doi.org/10.1098/rspa.2016.0475

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