Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)

We fabricated C-doped (1.5 wt.%) In(3)Sb(1)Te(2) (CIST) thin films with amorphous phase (a-CIST) using a sputter method. Two electrical-phase-changes at 250 and 275 °C were observed in the sheet resistance measurement. In order to understand the origin of these electrical-phase-changes, all samples...

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Autores principales: Lee, Y. M., Lee, S. Y., Sasaki, T., Kim, K., Ahn, D., Jung, M.-C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5144130/
https://www.ncbi.nlm.nih.gov/pubmed/27929133
http://dx.doi.org/10.1038/srep38663
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author Lee, Y. M.
Lee, S. Y.
Sasaki, T.
Kim, K.
Ahn, D.
Jung, M.-C.
author_facet Lee, Y. M.
Lee, S. Y.
Sasaki, T.
Kim, K.
Ahn, D.
Jung, M.-C.
author_sort Lee, Y. M.
collection PubMed
description We fabricated C-doped (1.5 wt.%) In(3)Sb(1)Te(2) (CIST) thin films with amorphous phase (a-CIST) using a sputter method. Two electrical-phase-changes at 250 and 275 °C were observed in the sheet resistance measurement. In order to understand the origin of these electrical-phase-changes, all samples were characterized by XRD, TEM, and HRXPS with synchrotron radiation. In a-CIST, only weak Sb-C bonding was observed. In the first electrical-phase-change at 250 °C, strong Sb-C bonding occurred without an accompanying structural/phase change (still amorphous). On the other hand, the second electrical-phase-change at 275 °C was due to the structural/phase change from amorphous to crystalline without a chemical state change.
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spelling pubmed-51441302016-12-16 Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2) Lee, Y. M. Lee, S. Y. Sasaki, T. Kim, K. Ahn, D. Jung, M.-C. Sci Rep Article We fabricated C-doped (1.5 wt.%) In(3)Sb(1)Te(2) (CIST) thin films with amorphous phase (a-CIST) using a sputter method. Two electrical-phase-changes at 250 and 275 °C were observed in the sheet resistance measurement. In order to understand the origin of these electrical-phase-changes, all samples were characterized by XRD, TEM, and HRXPS with synchrotron radiation. In a-CIST, only weak Sb-C bonding was observed. In the first electrical-phase-change at 250 °C, strong Sb-C bonding occurred without an accompanying structural/phase change (still amorphous). On the other hand, the second electrical-phase-change at 275 °C was due to the structural/phase change from amorphous to crystalline without a chemical state change. Nature Publishing Group 2016-12-08 /pmc/articles/PMC5144130/ /pubmed/27929133 http://dx.doi.org/10.1038/srep38663 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Lee, Y. M.
Lee, S. Y.
Sasaki, T.
Kim, K.
Ahn, D.
Jung, M.-C.
Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title_full Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title_fullStr Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title_full_unstemmed Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title_short Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In(3)Sb(1)Te(2)
title_sort two different phase-change origins with chemical- and structural-phase-changes in c doped (1.5 wt.%) in(3)sb(1)te(2)
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5144130/
https://www.ncbi.nlm.nih.gov/pubmed/27929133
http://dx.doi.org/10.1038/srep38663
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