Imaging Nanoscale Electromagnetic Near-Field Distributions Using Optical Forces

We demonstrate the application of Atomic Force Microscopy (AFM) for mapping optical near-fields with nanometer resolution, limited only by the AFM probe geometry. By detecting the optical force between a gold coated AFM probe and its image dipole on a glass substrate, we profile the electric field d...

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Detalles Bibliográficos
Autores principales: Huang, Fei, Ananth Tamma, Venkata, Mardy, Zahra, Burdett, Jonathan, Kumar Wickramasinghe, H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155520/
https://www.ncbi.nlm.nih.gov/pubmed/26073331
http://dx.doi.org/10.1038/srep10610

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155520/
https://www.ncbi.nlm.nih.gov/pubmed/26073331
http://dx.doi.org/10.1038/srep10610

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