High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quan...

Descripción completa

Detalles Bibliográficos
Autores principales: Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., Stanciu, G. A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155613/
https://www.ncbi.nlm.nih.gov/pubmed/26138665
http://dx.doi.org/10.1038/srep11876

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155613/
https://www.ncbi.nlm.nih.gov/pubmed/26138665
http://dx.doi.org/10.1038/srep11876

Ejemplares similares