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High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy
A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quan...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155613/ https://www.ncbi.nlm.nih.gov/pubmed/26138665 http://dx.doi.org/10.1038/srep11876 |
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author | Tranca, D. E. Stanciu, S. G. Hristu, R. Stoichita, C. Tofail, S. A. M. Stanciu, G. A. |
author_facet | Tranca, D. E. Stanciu, S. G. Hristu, R. Stoichita, C. Tofail, S. A. M. Stanciu, G. A. |
author_sort | Tranca, D. E. |
collection | PubMed |
description | A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine. |
format | Online Article Text |
id | pubmed-5155613 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-51556132016-12-20 High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy Tranca, D. E. Stanciu, S. G. Hristu, R. Stoichita, C. Tofail, S. A. M. Stanciu, G. A. Sci Rep Article A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine. Nature Publishing Group 2015-07-03 /pmc/articles/PMC5155613/ /pubmed/26138665 http://dx.doi.org/10.1038/srep11876 Text en Copyright © 2015, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Tranca, D. E. Stanciu, S. G. Hristu, R. Stoichita, C. Tofail, S. A. M. Stanciu, G. A. High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title | High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title_full | High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title_fullStr | High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title_full_unstemmed | High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title_short | High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
title_sort | high-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5155613/ https://www.ncbi.nlm.nih.gov/pubmed/26138665 http://dx.doi.org/10.1038/srep11876 |
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