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An Improvement in the Reliability of Standard Cell Enclosures
We describe the design of a new temperature-regulation circuit, which is used as an outer oven controller for new standard cell enclosures, with the emphasis on improving the reliability of the temperature control. A redundant protection circuit is used to prevent loss of temperature control caused...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5178259/ http://dx.doi.org/10.6028/jres.093.144 |