Cargando…
Direct Solids Analysis Using Sputter Initiated Resonance Ionization Spectroscopy (SIRIS)
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181929/ http://dx.doi.org/10.6028/jres.093.086 |