A low-cost DAC BIST structure using a resistor loop

This paper proposes a new DAC BIST (digital-to-analog converter built-in self-test) structure using a resistor loop known as a DDEM ADC (deterministic dynamic element matching analog-to-digital converter). Methods for both switch reduction and switch effect reduction are proposed for solving problem...

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Detalles Bibliográficos
Autores principales: Jang, Jaewon, Kim, Heetae, Kang, Sungho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2017
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5315403/
https://www.ncbi.nlm.nih.gov/pubmed/28212421
http://dx.doi.org/10.1371/journal.pone.0172331

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5315403/
https://www.ncbi.nlm.nih.gov/pubmed/28212421
http://dx.doi.org/10.1371/journal.pone.0172331

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