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On the Measurement of Dielectric Losses and Surface Conductivity of Dielectrics in Parallel Plane Test Capacitors
Thin slabs of dielectric materials are often tested for their dielectric properties in plane parallel plate capacitors. When surface conductivity is present, as for instance in freshly split mica, losses not connected with the bulk of the material arise. The present paper deals with the general theo...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1964
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5323089/ https://www.ncbi.nlm.nih.gov/pubmed/31834703 http://dx.doi.org/10.6028/jres.068A.018 |