Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction

We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed significant...

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Detalles Bibliográficos
Autores principales: Sarkar, Rohit, Ebner, Christian, Izadi, Ehsan, Rentenberger, Christian, Rajagopalan, Jagannathan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2016
Materias:
Original Report
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5356196/
https://www.ncbi.nlm.nih.gov/pubmed/28382229
http://dx.doi.org/10.1080/21663831.2016.1228709

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5356196/
https://www.ncbi.nlm.nih.gov/pubmed/28382229
http://dx.doi.org/10.1080/21663831.2016.1228709

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