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Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction
We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed significant...
Autores principales: | Sarkar, Rohit, Ebner, Christian, Izadi, Ehsan, Rentenberger, Christian, Rajagopalan, Jagannathan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5356196/ https://www.ncbi.nlm.nih.gov/pubmed/28382229 http://dx.doi.org/10.1080/21663831.2016.1228709 |
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