Polarized hard X-ray photoemission system with micro-positioning technique for probing ground-state symmetry of strongly correlated materials

An angle-resolved linearly polarized hard X-ray photoemission spectroscopy (HAXPES) system has been developed to study the ground-state symmetry of strongly correlated materials. The linear polarization of the incoming X-ray beam is switched by a transmission-type phase retarder composed of two diam...

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Detalles Bibliográficos
Autores principales: Fujiwara, Hidenori, Naimen, Sho, Higashiya, Atsushi, Kanai, Yuina, Yomosa, Hiroshi, Yamagami, Kohei, Kiss, Takayuki, Kadono, Toshiharu, Imada, Shin, Yamasaki, Atsushi, Takase, Kouichi, Otsuka, Shintaro, Shimizu, Tomohiro, Shingubara, Shoso, Suga, Shigemasa, Yabashi, Makina, Tamasaku, Kenji, Ishikawa, Tetsuya, Sekiyama, Akira
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5356621/
https://www.ncbi.nlm.nih.gov/pubmed/27140153
http://dx.doi.org/10.1107/S1600577516003003

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5356621/
https://www.ncbi.nlm.nih.gov/pubmed/27140153
http://dx.doi.org/10.1107/S1600577516003003

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