Symmetric curvature descriptors for label-free analysis of DNA

High-resolution microscopy techniques such as electron microscopy, scanning tunnelling microscopy and atomic force microscopy represent well-established, powerful tools for the structural characterization of adsorbed DNA molecules at the nanoscale. Notably, the analysis of DNA contours allows mappin...

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Detalles Bibliográficos
Autores principales: Buzio, Renato, Repetto, Luca, Giacopelli, Francesca, Ravazzolo, Roberto, Valbusa, Ugo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377314/
https://www.ncbi.nlm.nih.gov/pubmed/25248631
http://dx.doi.org/10.1038/srep06459

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377314/
https://www.ncbi.nlm.nih.gov/pubmed/25248631
http://dx.doi.org/10.1038/srep06459

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