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Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377351/ https://www.ncbi.nlm.nih.gov/pubmed/28381981 http://dx.doi.org/10.1107/S1600576717003831 |